Liel Hollander first joined Amster, Rothstein & Ebenstein LLP as a Summer Associate in 2007 and returned to the firm as an Associate in 2008. While at the firm, he has worked on a diverse range of intellectual property matters. Liel concentrates his practice on intellectual property law including patent, trademark, trade secret, and unfair competition.

He graduated in 2008 from St. John’s University School of Law where he was an editor of the New York Real Property Law Journal, a member of the Journal of Legal Commentary and received a CALI Award in Patent Law. He received a B.S. in Bioengineering from Syracuse University in 2004.